北京邮电大学学报

  • EI核心期刊

北京邮电大学学报 ›› 2018, Vol. 41 ›› Issue (2): 69-74.doi: 10.13190/j.jbupt.2017-119

• 论文 • 上一篇    下一篇

同轴连接器S参数建模及退化机理

纪锐1, 高锦春1, 谢刚2, 同阳3   

  1. 1. 北京邮电大学 电子工程学院, 北京 100876;
    2. 北京邮电大学 信息与通信工程学院, 北京 100876;
    3. 奥本大学 材料工程系, 奥本 36849
  • 收稿日期:2017-06-22 出版日期:2018-04-28 发布日期:2018-03-17
  • 作者简介:纪锐(1990-),女,博士生;高锦春(1962-),女,教授,博士生导师,E-mail:gjc@bupt.edu.cn.
  • 基金资助:
    国家自然科学基金项目(61674017)

Modeling and Analysis on S-parameters of Degraded Coaxial Connector

JI Rui1, GAO Jin-chun1, XIE Gang2, TONG Yang3   

  1. 1. School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China;
    2. School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China;
    3. Department of Materials Engineering, Auburn University, 36849, Auburn, AL, USA
  • Received:2017-06-22 Online:2018-04-28 Published:2018-03-17

摘要: 以Sub-Miniature-A(SMA)型连接器为例,建立了基于等效电路法的同轴连接器S参数模型,给出了模型参数的计算方法,模拟了连接器的高频特性.特别是针对连接器接触表面退化,计算出了接触表面的高频电参数,建立了S参数与退化表面的关系,可作为连接器故障特征应用于连接器的寿命预测、可靠性评估以及故障诊断的研究.

关键词: 同轴连接器, 接触失效, S参数, 等效电路

Abstract: S-parameters of Sub-Miniature-A (SMA) coaxial connector was calculated based on the equivalent circuit method, the high frequency characteristics of the connector effectively was simulated thereafter. Especially for the case of connector contact degradation, the parameters in the equivalent circuit model were calculated, and the relationship between the S-parameter and degraded level was established. The developed model could be used as a fault feature for the life prediction, reliability evaluation and fault diagnosis of the connector.

Key words: coaxial connector, contact degradation, S parameters, equivalent circuit

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