微带器件双端口测试的校准件设计

doi:10.13190/j.jbupt.2013.05.001

北京邮电大学学报 ›› 2013, Vol. 36 ›› Issue (5): 1-5.doi: 10.13190/j.jbupt.2013.05.001

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微带器件双端口测试的校准件设计

李秀萍, 任正, 李南

1. 北京邮电大学电子工程学院, 北京 100876;
2. 东南大学毫米波国家重点实验室, 南京 210096

收稿日期:2013-01-31 出版日期:2013-10-31 发布日期:2013-08-09
作者简介:李秀萍(1974-),女,教授,博士生导师,E-mail:xpli@bupt.edu.cn.
基金资助:
国家自然科学基金项目（61072009）；毫米波国家重点实验室项目（K201209）；中央高校基本科研业务费专项项目

Calibration Standard Design Based on the Microstrip Dual-Port Test

LI Xiu-ping, REN Zheng, LI Nan

1. School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China;
2. State Key Laboratory of Millimeter Waves, Southeast University, Nanjing 210096, China

Received:2013-01-31 Online:2013-10-31 Published:2013-08-09

摘要/Abstract

摘要：

通过校准修正矢量网络分析仪全部12项系统误差，利用Matlab程序实现了SOLT（short、open、load、through）和TRL（through、reflect、line）校准算法，去除误差项，得到真实的S参数。通过与矢网校准结果相对比验证了算法和程序的正确性，并在此基础上制作了SOLT和TRL微带结构校准件，并成功用于滤波器测试。

关键词: 校准件, 系统误差, 校准算法, S参数测量

Abstract:

Short、open、load、through (SOLT) and through、reflect、 line (TRL) calibration techniques were described. The 12-term system errors for two-port calibration were shown, and the actual S-parameters device was derived from the measured S-parameters by using matlab programs. Comparison between the matlab programs results and the vector network analyzer measurement data validated the correctness of the calibration approaches and procedures. The SOLT and TRL microstrip calibration standards were designed for microstrip filter measurement.

Key words: calibration standard, system errors, calibration algorithm, S-parameters measurement

中图分类号:

TN702

李秀萍, 任正, 李南. 微带器件双端口测试的校准件设计[J]. 北京邮电大学学报, 2013, 36(5): 1-5.

LI Xiu-ping, REN Zheng, LI Nan. Calibration Standard Design Based on the Microstrip Dual-Port Test[J]. JOURNAL OF BEIJING UNIVERSITY OF POSTS AND TELECOM, 2013, 36(5): 1-5.

微带器件双端口测试的校准件设计

Calibration Standard Design Based on the Microstrip Dual-Port Test

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