Journal of Beijing University of Posts and Telecommunications

  • EI核心期刊

JOURNAL OF BEIJING UNIVERSITY OF POSTS AND TELECOM ›› 2018, Vol. 41 ›› Issue (2): 69-74.doi: 10.13190/j.jbupt.2017-119

• Papers • Previous Articles     Next Articles

Modeling and Analysis on S-parameters of Degraded Coaxial Connector

JI Rui1, GAO Jin-chun1, XIE Gang2, TONG Yang3   

  1. 1. School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China;
    2. School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China;
    3. Department of Materials Engineering, Auburn University, 36849, Auburn, AL, USA
  • Received:2017-06-22 Online:2018-04-28 Published:2018-03-17

Abstract: S-parameters of Sub-Miniature-A (SMA) coaxial connector was calculated based on the equivalent circuit method, the high frequency characteristics of the connector effectively was simulated thereafter. Especially for the case of connector contact degradation, the parameters in the equivalent circuit model were calculated, and the relationship between the S-parameter and degraded level was established. The developed model could be used as a fault feature for the life prediction, reliability evaluation and fault diagnosis of the connector.

Key words: coaxial connector, contact degradation, S parameters, equivalent circuit

CLC Number: