[1] Zhu Hong, Hall P A V, May J H R. Software unit test coverage and adequacy[J]. ACM Computing Survey, 1997, 29(4):366-427.
[2] Hamlet R G. Testing programs with the aid of a compiler[J]. IEEE Transactions on Software Engineering, 1977, 3(4):279-290.
[3] DeMillo R A, Lipton R J, Sayward F G. Hints on test data selection:help for the practicing programmer[J]. Computer, 1978, 11(4):34-41.
[4] Andrews J H, Briand L C, Labiche Y. Is mutation an appropriate tool for testing experiments?[C]//Proceedings of the 27th International Conference on Software Engineering (ICSE'05). New York:ACM, 2005:402-411.
[5] Do H, Rothermel G. On the use of mutation faults in empirical assessments of test case prioritization techniques[J]. IEEE Transactions on Software Engineering, 2006, 32(9):733-752.
[6] Offutt A J, Lee A, Rothermel G, et al. An experimental determination of sufficient mutant operators[J]. ACM Transactions on Software Engineering and Methodology, 1996, 5(2):99-118.
[7] Jia Yue, Harman M. Constructing subtle faults using higher order mutation testing[C]//Proceedings of the 20088th IEEE International Working Conference on Source Code Analysis and Manipulation. Beijing:IEEE, 2008:249-258.
[8] DeMillo R A, Guindi D S, McCracken W M, et al. An extended overview of the Mothra software testing environment[C]//Proceedings of the second Workshop on Software Testing, Verification, and Analysis. Banff:IEEE, 1988.
[9] Delamaro M, Maldonad J C. Proteum-A tool for the assessment of test adequacy for C programs[C]//Proceedings of the Conference on Perform Ability in Computing Systems. Brunswick, NJ:[s.n.], 1996:79-95.
[10] Offutt A J, Hayes J H. A semantic model of program faults[C]//Proceedings of the 1996 ACM SIGSOFT International Symposium on Software Testing and Analysis. San Diego:ACM, 1996:195-200.
[11] DeMillo R A, Offutt A J. Constraint-based automatic test data generation[J]. IEEE Transactions on Software Engineering, 1991, 17(9):900-910.
[12] Voas J M. PIE:a dynamic failure-based technique[J]. IEEE Transactions on Software Engineering, 1992, 18(8):717-727.
[13] Chen W, Untch R H, Rothermel G, et al. Can fault-exposure-potential estimates improve the fault detection abilities of test suites?[J]. Software Testing, Verification and Reliability, 2002, 12(4):197-218.
[14] Tervonen T, van Valkenhoef G, Bastürk N, et al. Hit-and-run enables efficient weight generation for simulation-based multiple criteria decision analysis[J]. European Journal of Operational Research, 2013, 224(3):552-559.
[15] Valkenhoef G V, Tervonen T, Postmus D. Notes on Hit-and-run enables efficient weight generation for simulation-based multiple criteria decision analysis[J]. European Journal of Operational Research, 2014, 239(3):865-867.
[16] Harrell F E. Regression modeling strategies with applications to linear models, logistic regression and survival analysis[M]. New York:Springer, 2001.
[17] Cessie S L, Houwelingen J C V. Ridge estimators in logistic regression[J]. Applied Statistics, 1992, 41(1):191-201.
[18] Gelman A, Hill J L. Data analysis using regression and multilevel/hierarchical models[M]. Cambridge:Cambridge University Press, 2006.
[19] 金大海, 宫云战, 王雅文, 等. 软件代码测试技术[J]. 信息通信技术, 2015(3):34-39. Jin Dahai, Gong Yunzhan, Wang Yawen, et al. Software code test technology[J]. Information and Communications Technologies, 2015(3):34-39.
[20] 钱茛南, 宫云站, 王雅文, 等. 面向C语言的故障注入平台[J], 北京邮电大学学报, 2016, 39(3):95-99. Qian Gennan, Gong Yunzhan, Wang Yawen, et al. A C-language oriented fault injection platform[J]. Journal of Beijing University of Posts and Telecommunications, 2016, 39(3):95-99.
[21] Mirman D. Growth curve analysis and visualization using R[M]. Boca Raton, FL:Chapman & Hall/CRC Press, 2014.
[22] Friedman J, Hastie T, Tibshirani R. Regularization paths for generalized linear modelsvia coordinate descent[J]. J Stat Softw, 2010(33):1-22. |